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Testability Concepts for Digital ICs Rutilius Taurus Aemilianus DOERMANN Pathologisches Institut der Universität DOERMANN and Reference: A Prolegomenon to Guise Theory CASTAÑEDA Bad devices should not escape a test The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven

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Testability Concepts for Digital ICs Rutilius Taurus Aemilianus / DOERMANN Pathologisches Institut der Universität

Name: Testability Concepts for Digital ICs Rutilius Taurus Aemilianus / DOERMANN Pathologisches Institut der Universität
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